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Local ferroelectric responses of epitaxial PbTiO3 thin films to heated atomic force microscopy
- Seo, Jeongdae;
- Ahn, Yoonho;
- Kim, Woo Hee;
- Son, Jong Yeog
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2Citations
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2초록
We report the dependence of ferroelectric domain size of epitaxially grown PbTiO3 (PTO) thin films on Nb-doped SrTiO3 substrate to temperature. PbTiO3 exhibited well-defined ferroelectricity with a high remnant polarization of about 60 μC/cm2. Based on piezoelectric force microscopy (PFM) measurements, we confirmed that the ferroelectric domain size of PbTiO3 thin films depends on electric field and temperature. The minimum ferroelectric domain size could be reduced by the locally heated atomic force microscopy (h-AFM) technique. © 2016 Elsevier B.V. All rights reserved.
키워드
Activation energy; Ferroelectric domain size; Heated AFM; NONLINEAR DIELECTRIC MICROSCOPY; DATA-STORAGE; MEMORIES; Activation energy; Atomic force microscopy; Electric fields; Ferroelectric films; Ferroelectric materials; Ferroelectricity; AFM; Electric field and temperatures; Epitaxially grown; Ferroelectric domains; Ferroelectric response; Heated atomic force microscopy; Piezoelectric force microscopy; Remnant polarizations; Thin films
- 제목
- Local ferroelectric responses of epitaxial PbTiO3 thin films to heated atomic force microscopy
- 저자
- Seo, Jeongdae; Ahn, Yoonho; Kim, Woo Hee; Son, Jong Yeog
- 발행일
- 2016-04
- 유형
- Article
- 권
- 168
- 페이지
- 134 ~ 137
- 언어
- ENG
- 출판사
- Elsevier BV
- 발행국가
- 네덜란드
- 분량
- 4 페이지
- ISSN
- E 1873-4979
P 0167-577X