Analysis of transient degradation behaviors of organic light-emitting diodes under electrical stress

  • Lee, Gyeong Won; 
  • Choi, Yoonsuk; 
  • Kim, Heejin; 
  • Park, Jongwoo; 
  • Shim, Jong-In; 
  • ... Shin, Dong-Soo
Citations

WEB OF SCIENCE

3
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3

초록

Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.

키워드

Charge recombination and transport; Degradation; Organic light-emitting diodes; Transient; MECHANISMS; EFFICIENCY; TRANSPORT
제목
Analysis of transient degradation behaviors of organic light-emitting diodes under electrical stress
저자
Lee, Gyeong Won; Choi, Yoonsuk; Kim, Heejin; Park, Jongwoo; Shim, Jong-In; Shin, Dong-Soo
DOI
10.3390/app11167627
발행일
2021-08
유형
정기학술지(Article(Perspective Article포함))
저널명
APPLIED SCIENCES-BASEL
권
11
호
16
페이지
1 ~ 10