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Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems
- Pieper, N.J.;
- Chun, M.;
- Xiong, Y.;
- Dattilo, H.M.;
- Kronenberg, J.;
- ... Baeg, S.;
- 외 5명
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1초록
High-energy X-rays are used in PCB inspection systems to ensure electrical connectivity between components. The X-rays used in these systems often have energy ranging from a few keV to 150 keV. Exposure to these X-rays can cause a shift in individual transistor parameters due to total-ionizing dose (TID) effects. This damage is characterized for commercial PCB inspection systems along with mitigation techniques. © 2024 IEEE.
키워드
DRAM; Ring Oscillator; TID; X-rays
- 제목
- Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems
- 저자
- Pieper, N.J.; Chun, M.; Xiong, Y.; Dattilo, H.M.; Kronenberg, J.; Baeg, S.; Wen, S.-J.; Fung, R.; Chan, D.; Escobar, C.; Bhuva, B.L.
- 발행일
- 2024-04
- 유형
- Proceedings Paper
- 저널명
- 2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024
- 페이지
- 1 ~ 7