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Growth of rutile-TiO2 thin films via Sn doping and insertion of ultra-thin SnO2 interlayer by atomic layer deposition
- Lee, Dong-Kwon;
- Kwon, Se-Hun;
- Ahn, Ji-Hoon
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25초록
Rutile-TiO2 thin films have potential for use in high-k applications, such as dynamic random-access memory capacitors; however, they are difficult to realize without using noble-metal-based oxide substrates. Therefore, we proposed a new approach for the preparation of rutile TiO2 by a small amount of Sn doping and the insertion of ultra-thin SnO2 to achieve enhanced dielectric performance without using noble-metal-based electrodes. It was confirmed that the crystallinity of rutile TiO2 was remarkably enhanced in Sn-doped TiO2 formed on an ultra-thin SnO2 interlayer. Moreover, 10 nm-thick Sn-doped TiO2 thin film on a 1-nm SnO2 interlayer exhibited a high dielectric constant of about 80. (C) 2019 Elsevier B.V. All rights reserved.
키워드
- 제목
- Growth of rutile-TiO2 thin films via Sn doping and insertion of ultra-thin SnO2 interlayer by atomic layer deposition
- 저자
- Lee, Dong-Kwon; Kwon, Se-Hun; Ahn, Ji-Hoon
- 발행일
- 2019-07
- 유형
- Article
- 권
- 246
- 페이지
- 1 ~ 4
- 언어
- ENG
- 출판사
- ELSEVIER SCIENCE BV
- 발행국가
- 네덜란드
- 분량
- 4 페이지
- ISSN
- E 1873-4979
P 0167-577X