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A New Uncertain Decision Tree Method for Classifying Semiconductor Wafer Defect based on Multiple Wafer Maps
- 제목
- A New Uncertain Decision Tree Method for Classifying Semiconductor Wafer Defect based on Multiple Wafer Maps
- 저자
- 김병훈
- 발행일
- 2019-06-26
- 학회명
- The fifth International Conference of Interface between Statistics and Engineering (ICISE2019)
- 개최지
- 한양대학교 한양종합기술연구원