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Quantification of Deep-level Defects in Yellow InGaN/GaN Quantum Wells via Photo-assisted Capacitance-Voltage Measurements
- 제목
- Quantification of Deep-level Defects in Yellow InGaN/GaN Quantum Wells via Photo-assisted Capacitance-Voltage Measurements
- 저자
- 신동수
- 발행일
- 2023-06-01
- 학회명
- CSW 2023
- 개최지
- Ramada Plaza Jeju Hotel, Jeju, Korea