Photolithography-Based Micro patterning Integration of Quantum-Dot Electroluminescent Displays with Non volatile Charge Trap Memory

Citations

SCOPUS

0

초록

A memory-in-pixel (MIP) is demonstrated using non-volatile charge trap memory with an Al2O3/HfO2/Al2O3 (AHA) structure and integrated quantum dot light-emitting diodes (QDLED).The AHA structure exhibits high charge trapping capacity, achieving a 4.7 V memory window, Ion/off ratio of 108. The integration of QD-LED enables a self-erasing functionality via the photovoltaic effect without an external light source.

키워드

Charge Trap Thin-Film Transistor (CTTFT)High-Resolution DisplayMonolithic integrationQuantum Dot Light-Emitting Diodes (QD-LED)
제목
Photolithography-Based Micro patterning Integration of Quantum-Dot Electroluminescent Displays with Non volatile Charge Trap Memory
저자
Kim, Eun A.Park, SeoungminKim, YounghyunCho, Seong-Yong
DOI
10.1002/sdtp.18611
발행일
2025-08
유형
Conference Paper
저널명
Digest of Technical Papers - SID International Symposium
56
1
페이지
1985 ~ 1987