Characterization of Wetting Behavior on High Aspect Ratio Multilayer Structure

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초록

The wetting behavior of solutions was successfully visualized in the high aspect ratio multi-stack trench pattern using the inclined-AFM methodology. The visualization allows the characterization of the wetting behavior of cleaning solutions on various hydrophobic surfaces. The experimental results agreed with the values calculated by the Wenzel & Cassie-Baxter model. The wetting characteristic analysis using inclined-AFM is an efficient method regardless of pattern dimensions. © 2022 ECS - The Electrochemical Society.

제목
Characterization of Wetting Behavior on High Aspect Ratio Multilayer Structure
저자
Kim, Tae-Gon; Kim, Donggyu; Kim G.; Park, Jingoo
DOI
10.1149/10804.0131ecst
발행일
2022-06
유형
Conference paper
저널명
ECS Transactions
권
108
호
4
페이지
131 ~ 136