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Negative Capacitance Phenomenon Depending On The Wake-up Effect And The Measurement Temperature In The Ferroelectric Si:HfO2 Films
- 제목
- Negative Capacitance Phenomenon Depending On The Wake-up Effect And The Measurement Temperature In The Ferroelectric Si:HfO2 Films
- 저자
- 강보수
- 발행일
- 2018-08-06
- 학회명
- 12th Japan-Korea Conference on Ferroelectrics
- 개최지
- Nara hotel, Nara, Japan