An 11B Source-Driver IC with Resistor-Resistor-Embedded (RRE) DAC and Multi-Step Offset Calibration Achieving 1723 μm2/Channel and 1.6 mV DVO for 6285-PPI OLED-On-Silicon Displays

  • Bae, Chong-Hwa
  • Park, Hyeon-Ho
  • Yoo, Wiman
  • Oh, Junghwan
  • Kim, Dong-Hyun
  • ... Kim, Jong-Seok
  • 외 4명
Citations

SCOPUS

0

초록

This paper presents an 11b source-driver IC for OLED-onSilicon (OLEDoS) displays that achieves small area by using a three-stage resistor-resistor-embedded (RRE) DAC and lowvoltage DAC. The proposed data-dependent current source (D2CS), spare amplifier, R -share logic, and multi-step offset calibration (MOCU) suppress DVO under massive channel operation. In addition, a proposed high-pass-filter-assisted dynamic current source (HPDCS) enables high frame-rate operation. Fabricated in 65 nm CMOS, the proposed SD-IC achieves a channel area of 1,723 μm2, a maximum DVO of 1.6 mV with a 1000 -channel load, and a settling time of 0.69 μs. © 2026 IEEE.

제목
An 11B Source-Driver IC with Resistor-Resistor-Embedded (RRE) DAC and Multi-Step Offset Calibration Achieving 1723 μm2/Channel and 1.6 mV DVO for 6285-PPI OLED-On-Silicon Displays
저자
Bae, Chong-HwaPark, Hyeon-HoYoo, WimanOh, JunghwanKim, Dong-HyunPark, Gang-BaeKim, MungyuKwon, ChankeunHa, DongwanKim, Jong-Seok
DOI
10.1109/VLSITechnologyandCir65830.2026.11577439
발행일
2026-07
유형
Conference paper
저널명
Digest of Technical Papers - Symposium on VLSI Technology