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Dose Measurements and Effects in DRAMs During PCB Inspections Using X-rays
초록
Under the PCB inspection environment, TID levels were measured for various combinations of filters, PCB, and packages to demonstrate significant variances in TID effects by X-rays. Retention-time degradations were compared for 1y-nm DRAM components.
- 제목
- Dose Measurements and Effects in DRAMs During PCB Inspections Using X-rays
- 저자
- 백상현
- 발행일
- 2024-07
- 유형
- Proceeding
- 저널명
- NSREC - IEEE Nuclear & Space Radiation Effects Conference
- 페이지
- 1 ~ 4