Polarization retention in Pb(Zr0.4Ti0.6)O-3 capacitors with IrO2 top electrodes

  • Kang, BS; 
  • Kim, DJ; 
  • Jo, JY; 
  • Noh, TW; 
  • Yoon, JG; 
  • 외 5명
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초록

The retention characteristics of Ir/IrO2/Pb(Zro(0.4)Ti(0.6))O-3(PZT)/Pt/IrO2 capacitors were investigated by measuring the switching and nonswitching polarizations, the switching current profiles, and the P-V hysteresis loops. The retention losses of Ir/IrO2 /PZT/Pt/IrO2 capacitors were compared with those of the Pt/PZT/Pt capacitors, and a significant improvement of an opposite-state retention was observed. It was found that the growth and the relaxation behaviors of the internal field are quite similar for both capacitors, but that the polarization backswitching becomes significantly smaller for the PZT capacitors with the IrO2 top electrodes. The difference in polarization backswitching might originate from the nature of the ferroelectric/electrode interfaces, possibly suppressing the nucleation of opposite domains at the interfaces. (C) 2004 American Institute of Physics.

키워드

PB(ZR,TI)O-3 THIN-FILMS; CRYSTALLIZATION; TEMPERATURE; FATIGUE; PB(ZR,TI)O-3 THIN-FILMS; CRYSTALLIZATION; TEMPERATURE; FATIGUE
제목
Polarization retention in Pb(Zr0.4Ti0.6)O-3 capacitors with IrO2 top electrodes
저자
Kang, BS; Kim, DJ; Jo, JY; Noh, TW; Yoon, JG; Song, TK; Lee, YK; Lee, JK; Shin, S; Park, YS
DOI
10.1063/1.1710715
발행일
2004-04
유형
Article
저널명
Applied Physics Letters
권
84
호
16
페이지
3127 ~ 3129