Nonradiative recombination mechanisms in InGaN/GaN light-emitting diodes analyzed by various device characterization techniques

  • Shin, Dong Soo; 
  • Han, Dong-Pyo; 
  • Zheng, Dong-Guang; 
  • Oh, Chan-Hyoung; 
  • Kim, Hyun-Sung; 
  • 외 2명
Citations

SCOPUS

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초록

In InGaN/GaN blue light-emitting diodes (LEDs) widely utilized for general lighting, there exist various material issues that lead to the unwanted nonradiative recombination. In this paper, we utilize various characterization techniques to investigate the nonradiative recombination mechanisms in LED devices. With the characterization techniques such as temperature-dependent external quantum efficiency, current-voltage, and electroluminescence spectra, we show that different nonradiative recombination processes such as the Shockley-Read-Hall recombination and the defect-assisted tunneling can play roles in the LED devices. Information on the dominant nonradiative recombination obtained by these analyses can be used for further improving the quantum efficiency of the device. © 2015 SPIE.

키워드

defect; InGaN; Light-emitting diode; nonradiative recombination; temperature-dependent electroluminescence; Characterization; Defects; Diodes; Electroluminescence; Gallium nitride; Light; Nitrides; Quantum efficiency; Characterization techniques; Electroluminescence spectra; External quantum efficiency; InGaN; Non-radiative recombinations; Nonradiative recombination process; Shockley-Read-Hall recombinations; Temperature dependent; Light emitting diodes
제목
Nonradiative recombination mechanisms in InGaN/GaN light-emitting diodes analyzed by various device characterization techniques
저자
Shin, Dong Soo; Han, Dong-Pyo; Zheng, Dong-Guang; Oh, Chan-Hyoung; Kim, Hyun-Sung; Kim, Kyu-Sang; Shim, Jong-In
DOI
10.1117/12.2078970
발행일
2015-03
유형
Conference Paper
저널명
Proceedings of SPIE - The International Society for Optical Engineering
권
9363
페이지
1 ~ 4