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Robust Wafer Defect Pattern Classification and New Defect Pattern Detection in Imbalanced Data Using Few-Shot Learning
- 제목
- Robust Wafer Defect Pattern Classification and New Defect Pattern Detection in Imbalanced Data Using Few-Shot Learning
- 저자
- 김병훈
- 발행일
- 2024-10-20
- 학회명
- 2024 INFORMS ANNUAL MEETING
- 개최지
- Seattle Convention Center