Nucleation and Layer Closure Behavior of Iridium Films Grown Using Atomic Layer Deposition

  • Chung, Hong Keun
  • Kim, Han
  • Jeon, Jihoon
  • Kim, Sung-Chul
  • Won, Sung Ok
  • ... Park, Tae Joo
  • 외 5명
Citations

WEB OF SCIENCE

10
Citations

SCOPUS

10

초록

Understanding the initial growthprocess during atomiclayer deposition(ALD) is essential for various applications employing ultrathin films.This study investigated the initial growth of ALD Ir films using tricarbonyl-(1,2,3-& eta;)-1,2,3-tri(tert-butyl)-cyclopropenyl-iridium and O-2. IsolatedIr nanoparticles were formed on the oxide surfaces during the initialgrowth stage, and their density and size were significantly influencedby the growth temperature and substrate surface, which strongly affectedthe precursor adsorption and surface diffusion of the adatoms. Higher-densityand smaller nanoparticles were formed at high temperatures and onthe Al2O3 surface, forming a continuous Ir filmwith a smaller thickness, resulting in a very smooth surface. Thesefindings suggest that the initial growth behavior of the Ir filmsaffects their surface roughness and continuity and that a comprehensiveunderstanding of this behavior is necessary for the formation of continuousultrathin metal films.

키워드

ELECTRICAL-RESISTIVITY MODELPOLYCRYSTALLINE FILMSELECTRODESNANOPARTICLESREFLECTIONOXYGENMETALTIO2
제목
Nucleation and Layer Closure Behavior of Iridium Films Grown Using Atomic Layer Deposition
저자
Chung, Hong KeunKim, HanJeon, JihoonKim, Sung-ChulWon, Sung OkHarada, RyosukeTsugawa, TomohiroChung, Yoon JangBaek, Seung-HyubPark, Tae JooKim, Seong Keun
DOI
10.1021/acs.jpclett.3c01369
발행일
2023-07
유형
Article
저널명
The Journal of Physical Chemistry Letters
14
28
페이지
6489 ~ 6493