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Effect of corrosion inhibitor, 1H-benzotriazole (BTAH), on particle adhesion in Cu CMP
- Song, Jae-Hoon;
- Hong, Yi-Koan;
- Kim, Tae-Gon;
- Kang, Young-Jae;
- Kim, In-Kwon;
- ... Park, Jin-Goo;
- 외 2명
초록
The adhesion force of silica and pad particles on Cu wafer surfaces were theoretically and experimentally investigated in slurry solutions of different pHs with and without the addition of a corrosion inhibitor, 1H-benzotriazole (BTAH). Isoelectric point (IEP) of pad particles was measured to be around 3. Pad particles showed a lower adhesion force in DI water than silica, however resulted in a higher force when BTA was added in DI water. The magnitude of adhesion force of pad particles increased as a function of BTA concentration. The lowest zeta potential of silica particles was measured when 0.01 wt% of BTA was added in DI water. A higher adhesion force was measured on silica particles at pH 3 with the presence of BTA. The increase of pH to neutral to alkaline significantly reduced the adhesion forces of both silica and pad particles © 2005 The Electrochemical Society.
- 제목
- Effect of corrosion inhibitor, 1H-benzotriazole (BTAH), on particle adhesion in Cu CMP
- 저자
- Song, Jae-Hoon; Hong, Yi-Koan; Kim, Tae-Gon; Kang, Young-Jae; Kim, In-Kwon; Ran, Ja-Hyung; Park, Jin-Goo; Busnaina, Ahmed A.
- 발행일
- 2005-10
- 학회명
- 9th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing - 2005 Fall Meeting of the Electrochemical Society
- 개최지
- Los Angeles, CA
- 개최국가
- 미국
- 학회 개최일
- 2005-10-16 ~ 2005-10-21
- 언어
- ENG