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메모리 뱅크 기반 불량 검출 기술

Defect Inspection Using Memory Bank Based Anomaly Detection
제목
메모리 뱅크 기반 불량 검출 기술
제목 (타언어)
Defect Inspection Using Memory Bank Based Anomaly Detection
저자
박태준; 윤종완; 고병진; 이승재
발행일
2024-10-31
출원번호
C-2024-039589
등록번호
C-2024-039589
출원일
2024-10-31
등록일
2024-10-31

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