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Light: Science & Applications

ISSN

P 2095-5545 E 2047-7538

출판사

Nature Publishing Group

국가

ENGLAND

발행 상태

활성

데이터베이스 수록 정보

CiteScore 2012-2025 (14년)

DOAJ 2017-2025 (9년)

JCR 2013-2025 (13년)

SCIE 2013-2026 (14년)

Scopus 2012-2026 (15년)

SJR 2013-2020, 2022-2025 (12년)

전체 33건 중 1번부터 10번까지의 결과를 표시합니다.

2026

Article

Uniaxially Compressively Strained Ge (100)-OI p-MOSFET for High-Performance CFET

Lim, Hyeongrak ;
Kim, Seong Kwang ;
Jeong, Hojin ;
Lim, Jinha ;
Kuk, Songhyeon ;
... Kim, Younghyun ;
외 7명

2026-07
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Quantitative Analysis of Surface Potential Fluctuation at MOS Interfaces Using Conductance Method

Shin, Sanghoon ;
Taoka, Noriyuki ;
Takenaka, Mitsuru ;
Takagi, Shinichi

2026-03
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2025

Article

Improved Optoelectronic Performance of InGaN/AlGaN Near-Ultraviolet LEDs: Effect of n-GaN Thickness

Islam, Abu Bashar Mohammad Hamidul ;
Shin, Dong-Soo ;
Kwak, Joon Seop ;
Shim, Jong-In

2025-12
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Heterogeneous 3-D Sequential CFET With Strain-Engineered Ge (100) Top-Channel pMOSFET on Bulk Si (100) nMOSFET

Lim, Hyeongrak ;
Kim, Seong Kwang ;
Lee, Seung Woo ;
Park, Youngkeun ;
Jeong, Jaejoong ;
... Kim, Younghyun ;
외 7명

2025-06
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2024

Article

Effect of Source/Drain Electrode Materials on the Electrical Performance and Stability of Amorphous Indium-Tin-Zinc-Oxide FETs

An, Seong Ui ;
Ahn, Dae-Hwan ;
Ju, Gijun ;
Chen, Simin ;
Ji, Yo Seop ;
... Kim, Jaekyun ;
... Kim, Younghyun ;
외 1명

2024-09
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

SAW Device With Reactive Reflector for Integrated SAW RF Duplexer Area Minimization

Seong, Minsang ;
Kim, Jungsun ;
Eo, Yungseon

2024-08
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Improvement of Amorphous InGaZnO Thin-Film Transistor Reliability and Electrical Performance Using ALD SiO2 Interfacial Layer on PECVD SiO2 Gate Insulator

Lee, Taeho ;
Oh, Saeroonter.

2024-01
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Effect of X-Ray Irradiation on Colloidal Quantum Dot SWIR CMOS Image Sensor

Jin, Minhyun ;
Lee, Sang Yeon ;
Santos, Pedro ;
Kang, Jubin ;
Georgitzikis, Epimitheas ;
외 6명

2024-01
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2023

Article

Heterogeneous 3-D Sequential CFETs With Ge (110) Nanosheet p-FETs on Si (100) Bulk n-FETs

Kim, Seong Kwang ;
Lim, Hyeong-Rak ;
Jeong, Jaejoong ;
Lee, Seung Woo ;
Jeong, Ho Jin ;
... Kim, Younghyun ;
외 10명

2023-11
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

IGZO Source-Gated Transistor for AMOLED Pixel Circuit

Huang, Shan ;
Jin, Jidong ;
Kim, Jaekyun ;
Wu, Wenjing ;
Song, Aimin ;
외 1명

2023-07
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC