상세 보기
자료 필터
자료유형
발행연도
1992 ~ 2020
1992 2020
키워드
언어
전체 86건 중 1번부터 10번까지의 결과를 표시합니다.
2020
Article
A Digital Camera-Based Rotation-Invariant Fingerprint Verification Method
- Khan, Sajid ;
- Lee, Dong-Ho ;
- Khan, Asif ;
- Waqas, Ahmad ;
- Gilal, Abdul Rehman ;
- 외 1명
- 2020-05
- Scientific Programming
- HINDAWI LTD
Article
Image Interpolation via Gradient Correlation-Based Edge Direction Estimation
- Khan, Sajid ;
- Lee, Dong-Ho ;
- Khan, Muhammad Asif ;
- Siddiqui, Muhammad Faisal ;
- Zafar, Raja Fawad ;
- 외 2명
- 2020-04
- Scientific Programming
- HINDAWI LTD
Article
Efficient and improved edge detection via a hysteresis thresholding method
- Khan, Sajid ;
- Lee, Dong-Ho ;
- Khan, Muhammad Asif ;
- Gilal, Abdul Rehman ;
- Iqbal, Junaid ;
- 외 1명
- 2020-03
- Current Science
- INDIAN ACAD SCIENCES
2019
Article
Efficient Edge-Based Image Interpolation Method Using Neighboring Slope Information
- Khan, Sajid ;
- Lee, Dong-Ho ;
- Khan, Muhammad Asif ;
- Gilal, Abdul Rehman ;
- Mujtaba, Ghulam
- 2019-09
- IEEE Access
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2018
Article
Generalised kernel weighted fuzzy C-means clustering algorithm with local information
- Memon, Kashif Hussain ;
- Lee, Dong-Ho
- 2018-06
- Fuzzy Sets and Systems
- ELSEVIER SCIENCE BV
2017
Article
An adaptive dynamically weighted median filter for impulse noise removal
- Khan, Sajid ;
- Lee, Dong-Ho
- 2017-09
- EURASIP JOURNAL ON ADVANCES IN SIGNAL PROCESSING
- SPRINGER INTERNATIONAL PUBLISHING AG
Article
Generalised fuzzy c-means clustering algorithm with local information
- Memon, Kashif Hussain ;
- Lee, Dong-Ho
- 2017-01
- IET Image Processing
- INST ENGINEERING TECHNOLOGY-IET
2015
Article
Efficient deinterlacing method using simple edge slope tracing
- Khan, Sajid ;
- Lee, Dongho
- 2015-10
- Optical Engineering
- SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
2013
Article
Memory Reliability Analysis for Multiple Block Effect of Soft Errors
- Lee, Soonyoung ;
- Jeon, Sang Hoon ;
- Baeg, Sanghyeon ;
- Lee, Dongho
- 2013-04
- IEEE Transactions on Nuclear Science
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
1