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자료 필터
자료유형
발행연도
2021 ~ 2026
2021 2026
키워드
언어
전체 7건 중 1번부터 7번까지의 결과를 표시합니다.
2026
Article
Application of machine learning to predict employment attainment among individuals with intellectual and developmental disabilities
- Lee, Chung Eun ;
- Koo, Jaehoon ;
- Li, Chak
- 2026-01
- Research in Developmental Disabilities
- PERGAMON-ELSEVIER SCIENCE LTD
2024
Article
Corrigendum to “An inverse classification framework with limited budget and maximum number of perturbed samples” [Exp. Syst. Appl. 212 (2023) 118761] (Expert Systems With Applications (2023) 212, (S0957417422017791), (10.1016/j.eswa.2022.118761))
- Koo, Jaehoon ;
- Klabjan, Diego ;
- Utke, Jean
- 2024-11
- Expert Systems with Applications
- PERGAMON-ELSEVIER SCIENCE LTD
Article
EFIT-Prime: Probabilistic and physics-constrained reduced-order neural network model for equilibrium reconstruction in DIII-D
- Madireddy, Sandeep ;
- Akçay, Cihan ;
- Kruger, Scott E. ;
- Amara, T. Bechtel ;
- Sun, Xuan ;
- ... Koo, Jaehoon ;
- 외 5명
- 2024-09
- Physics of Plasmas
- AIP Publishing
2023
Article
Transfer-learning-based Autotuning using Gaussian Copula
- Randall,Thomas ;
- Koo,Jaehoon ;
- Videau,Brice ;
- Kruse,Michael ;
- Wu,Xingfu ;
- 외 4명
- 2023-06
- PROCEEDINGS OF THE 37TH INTERNATIONAL CONFERENCE ON SUPERCOMPUTING, ACM ICS 2023
- ASSOC COMPUTING MACHINERY
Article
An inverse classification framework with limited budget and maximum number of perturbed samples
- Koo, Jaehoon ;
- Klabjan, Diego ;
- Utke, Jean
- 2023-02
- Expert Systems with Applications
- PERGAMON-ELSEVIER SCIENCE LTD
2022
Article
Application of machine learning and artificial intelligence to extend EFIT equilibrium reconstruction
- Lao, Lang L. ;
- Kruger, Scott E. ;
- Akçay, Cihan ;
- Balaprakash, Prasanna ;
- Bechtel, Torrin A. ;
- ... Koo, Jaehoon ;
- 외 12명
- 2022-06
- Plasma Physics and Controlled Fusion
- Institute of Physics Publishing
2021
Article
A Unified Defect Pattern Analysis of Wafer Maps Using Density-Based Clustering
- Koo, Jaehoon ;
- Hwang, Sangheum
- 2021-05
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.