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김병훈
Kim, Byunghoon
ERICA 공학대학
ERICA 산업경영공학과
연구분야
- Data mining techniques with application to semiconductor manufacturing,
- High dimensional data analysis,
- Network analysis,
- 고차원 데이터 분석,
- 네트워크 분석,
- 데이터 마이닝 방법론의 반도체 공정 응용 및 개발
자료 필터
자료유형
발행연도
2014 ~ 2026
2014 2026
키워드
언어
전체 56건 중 41번부터 50번까지의 결과를 표시합니다.
2019
Conference
A New Uncertain Data Classification Method and Its Application in Semiconductor Manufacturing
- 2019-10-20
Article
Maintenance Optimization for Repairable Deteriorating Systems under Imperfect Preventive Maintenance
- Lee, Juhyun ;
- Kim, Byunghoon ;
- Ahn, Suneung
- 2019-08
- MATHEMATICS
- MDPI
Conference
A New Uncertain Decision Tree Method for Classifying Semiconductor Wafer Defect based on Multiple Wafer Maps
- 2019-06-26
2017
Article
Data mining-based variable assessment methodology for evaluating the contribution of knowledge services of a public research institute to business performance of firms
- Choi,Jeongsub ;
- Kim,Byunghoon ;
- Hahn,Hyuk ;
- Park, Hun ;
- Jeong, Yongil ;
- 외 2명
- 2017-10
- Expert Systems with Applications
- Elsevier
Article
Two-phase edge outlier detection method for technology opportunity discovery
- Kim,Byunghoon ;
- Gazzola, Gianluca ;
- Yang, Jaekyung ;
- Lee, Jae-min ;
- Coh, Byoung Youl ;
- 외 2명
- 2017-10
- Scientometrics
- Akademiai Kiado
2016
Article
Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery
- Rodriguez, Andrew D. ;
- Tosyali, Ali ;
- Kim, Byunghoon ;
- Choi, Jeongsub ;
- Lee,Jae-min ;
- 외 2명
- 2016-11
- IEEE Transactions on Engineering Management
- Institute of Electrical and Electronics Engineers
Article
Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps
- Kim,Byunghoon ;
- Jeong, Youngseon ;
- Tong, Seunghoon ;
- Chang, Inkap ;
- Jeong, Myongkee
- 2016-02
- IEEE Transactions on Semiconductor Manufacturing
- Institute of Electrical and Electronics Engineers