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김병훈
Kim, Byunghoon
ERICA 공학대학
ERICA 산업경영공학과
연구분야
- Data mining techniques with application to semiconductor manufacturing,
- High dimensional data analysis,
- Network analysis,
- 고차원 데이터 분석,
- 네트워크 분석,
- 데이터 마이닝 방법론의 반도체 공정 응용 및 개발
자료 필터
자료유형
발행연도
2014 ~ 2026
2014 2026
키워드
언어
전체 56건 중 51번부터 56번까지의 결과를 표시합니다.
2015
Article
Quantifying the Risk Level of Functional Chips in DRAM Wafers
- Jeong, Young-Seon ;
- Kim, Byunghoon ;
- Tong, Seung Hoon ;
- Chang, In-Kap ;
- Jeong, Myong K.
- 2015-11
- IEEE Intelligent Systems
- Institute of Electrical and Electronics Engineers
Article
New multi-stage similarity measure for calculation of pairwise patent similarity in a patent citation network
- Rodriguez, Andrew D. ;
- Kim, Byunghoon ;
- Turkoz, Mehmet ;
- Lee,Jae-min ;
- Coh, Byoung Youl ;
- 외 1명
- 2015-05
- Scientometrics
- Akademiai Kiado
Article
Modelling of technology lifetime based on patent citation data and segmentation
- Yoo, Sun-hi ;
- Kim, Byunghoon ;
- Jeong, Myongkee
- 2015-03
- Journal of the Operational Research Society
- Palgrave Macmillan Ltd.
Article
A regularized singular value decomposition-based approach for failure pattern classification on fail bit map in a DRAM wafer
- Kim, Byunghoon ;
- Jeong, Youngseon ;
- Tong,Seunghoon ;
- Chang,Inkap ;
- Jeong, Myongkee
- 2015-02
- IEEE Transactions on Semiconductor Manufacturing
- Institute of Electrical and Electronics Engineers
Article
Graph kernel based measure for evaluating the influence of patents in a patent citation network
- Rodriguez,Andrew D. ;
- Kim, Byunghoon ;
- Lee, Jae-min ;
- Coh,Byoung Youl ;
- Jeong, Myongkee
- 2015-02
- Expert Systems with Applications
- Elsevier
2014
Article
Inter-cluster connectivity analysis for technology opportunity discovery
- Kim, Byunghoon ;
- Gazzola,Gianluca ;
- Lee,Jae-min ;
- Kim, Dohyun ;
- Kim,Kanghoe ;
- 외 1명
- 2014-03
- Scientometrics
- Akademiai Kiado