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자료 필터
자료유형
발행연도
2005 ~ 2026
2005 2026
키워드
언어
전체 158건 중 1번부터 10번까지의 결과를 표시합니다.
2026
Article
Contributions of Photon Reaction Processes to Displacement Damages with 7-MeV X-Ray Irradiation
- Kim, Boeun ;
- Jeon, Seongyoung ;
- Baeg, Sanghyeon
- 2026-05
- IEEE International Reliability Physics Symposium Proceedings
Article
Capacitance Based Fault Analysis of High-Speed Interfaces Through Correlation of Bit Error Rate and VNA Measurements
- Waqar, Muhammad ;
- Park, HyeonU ;
- Chang, Young-Bin ;
- Jeon, Seongyoung ;
- Baeg, Sanghyeon
- 2026-04
- IEEE Transactions on Instrumentation and Measurement
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2025
Article
Reassessing March Test Effectiveness in System Memory Error Detection through Inductive Fault Analysis
- Kim, Jeonghwan ;
- Baeg, Sanghyeon
- 2025-12
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
In-Situ Analysis of Crack Propagation in Wire Bonds Causing Intermittent Failures in Electronic Systems with Liquid-Nitrogen Thermal Shock Testing
- Chang, Youngbin ;
- Waqar, Muhammad ;
- Baeg, Sanghyeon
- 2025-10
- IEEE Transactions on Components, Packaging and Manufacturing Technology
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Ball Grid Array Package Intermittent Partial Connection Defect Analysis in DDR4 Data Channel
- Waqar, Muhammad ;
- Chang, Young-Bin ;
- Park, HyeonU ;
- Baeg, Sanghyeon
- 2025-02
- IEEE Transactions on Components, Packaging and Manufacturing Technology
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2024
Article
Dose Measurements and Effects in DRAMs During PCB Inspections Using X-rays
- 2024-07
- NSREC - IEEE Nuclear & Space Radiation Effects Conference
- NSREC - IEEE Nuclear & Space Radiation Effects Conference
Article
DDR4의 VRT Cell에 대한 Signature 고찰(A Signature Review of VRT Cells in DDR4)
- 2024-07
- 2024 Korea Test Conference
- 한국반도체테스트학회
Article
Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems
- Pieper, N.J. ;
- Chun, M. ;
- Xiong, Y. ;
- Dattilo, H.M. ;
- Kronenberg, J. ;
- ... Baeg, S. ;
- 외 5명
- 2024-04
- 2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024
- IEEE
2023
Article
Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components
- Oh, Hyeongseok ;
- Chun, Myungsun ;
- Lee, Jiwon ;
- Wen, Shi-Jie ;
- Yu, Nick ;
- ... Baeg, Sanghyeon ;
- 외 1명
- 2023-05
- 2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS
- IEEE
Article
DDR4 Ball Grid Array Package Intermittent Fracture Effect on Signal Integrity
- Waqar, Muhammad ;
- Chang, Young-Bin ;
- Kwon, Junhyeong ;
- Kim, Jeong-Hwan ;
- Baeg, Sanghyeon
- 2023-01
- IEEE Transactions on Components, Packaging and Manufacturing Technology
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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